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Applied focused ion beam techniques for sample
preparation of astromaterials for integrated
nano-analysis.
Graham G. A., Teslich N. E., Kearsley A. T., Stadermann
F. J., Stroud R. M., Dai Z., Ishii H. A., Hutcheon I. D.,
Bajt S., Snead C. J., Weber P. K., and Bradley J. P.
(2008)
Meteorit. Planet. Sci., in press.
ABSTRACT
coming soon
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