Focused ion beam recovery and analysis of interplanetary dust particles (IDPs) and stardust analogues

Graham G. A., Bradley J. P., Bernas M., Stroud R. M., Dai Z. R., Floss C., Stadermann F. J., Snead C. J., and Westphal A. J. (2004)
Lunar and Planetary Science XXXV, Abstract #2044, LPI Houston.


ABSTRACT

Meteoritics research is a major beneficiary of recent developments in analytical instrumentation. Integrated studies in which multiple analytical techniques are applied to the same specimen are providing new insight about the nature of IDPs. Such studies are dependent on the ability to prepare specimens that can be analyzed in multiple instruments. Focused ion beam (FIB) microscopy has revolutionized specimen preparation in materials science. Although FIB has successfully been used for a few IDP and meteorite studies, it has yet to be widely utilized in meteoritics. We are using FIB for integrated TEM/NanoSIMS/synchrotron infrared (IR) studies.


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