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High sensitivity measurements with the new
NanoSIMS
Stadermann F. J. (2001) 33rd Great Lakes/Central Joint
Regional Meeting, Amercian Chemical Society, Grand Rapids,
Michigan.
ABSTRACT
The first commercial instrument of a new type of ion
microprobe -the NanoSIMS- has just been installed at
Washington University in St. Louis. Its unique features
include a primary ion beam diameter as low as 30 nm, a high
secondary ion transmission even at high mass resolution and
parallel secondary ion detectors for up to six masses. The
NanoSIMS is therefore particularly well suited for the
chemical and isotopic analysis of sub-micrometer particles
or phases, both in imaging and in point mode. The main focus
of our work is the characterization of presolar and
interplanetary dust particles, as well as the measurement of
mineral phases directly in geological TEM slices, but the
NanoSIMS clearly has applications in a much wider field,
ranging from biology to material science.
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